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Semiconductor
Package Test
FA Support
Burn-In Test
Automotive Electronics
接插件
Consumer Electronics
Standard Connector
BTB Connector
High Frequency Probe
NEWS
DOWNLOAD
CONTACT US
PRODUCTS
HOME
/
PRODUCTS
PRODUCTS
Semiconductor
Package Test
FA Support
Burn-In Test
Automotive Electronics
接插件
Consumer Electronics
Standard Connector
BTB Connector
High Frequency Probe
Manual Lid Test Socket
Test socket with manual lid, for engineer testing, lab validation.
Features
High durability
Pitch ≥ 0.35mm
Fast delivery
Mechanical
A
B
D1
D2
E1
E2
CT100
26
26
20
20
11.5
11.5
CT125
32
32
26
26
17.5
17.5
CT150
40
40
34
34
25.5
25.5
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